Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13742183
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Filing Dt:
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01/15/2013
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Publication #:
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Pub Dt:
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05/30/2013
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Inventors:
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Sanjeev Grover, Donald W. Chiu, John W. Andberg
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Title:
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TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SHIN-MARUNOUCHI CENTER BUILDING, 1-6-2 MARUNOUCHI, |
| TOKYO, JAPAN 100-0005 |
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| MURABITO, HAO & BARNES LLP |
| 2 N MARKET STREET |
| 3RD FLOOR |
| DSAN JOSE, CA 95113 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED AT REEL: 035375 FRAME: 0233. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| 1-32-1 ASAHI-CHO 1-CHOME NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
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| MURABITO HAO & BARNES LLP |
| 2 N MARKET STREET |
| 3RD FLOOR |
| SAN JOSE, CA 95113 |
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