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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/30/2014
Application #:
13711850
Filing Dt:
12/12/2012
Publication #:
Pub Dt:
06/20/2013
Inventor:
Hiroshi Sugawara
Title:
FABRICATION AND TESTING METHOD FOR NONVOLATILE MEMORY DEVICES
Assignment: 1
Reel/Frame:
029454/0006Recorded: 12/12/2012Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/05/2012
Assignee:
129, SAMSUNG-RO, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 443-742
Correspondent:
VOLENTINE & WHITT, PLLC
11951 FREEDOM DRIVE, SUITE 1300
RESTON, VA 20190

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