Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/02/2017
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Application #:
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13791537
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Filing Dt:
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03/08/2013
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Publication #:
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Pub Dt:
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09/19/2013
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Inventors:
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Haruhiko KUSUNOSE, Hiroki MIYAI
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Title:
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DEFECT COORDINATES MEASUREMENT DEVICE, DEFECT COORDINATES MEASUREMENT METHOD, MASK MANUFACTURING METHOD, AND REFERENCE MASK
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2-10-1 SHIN-YOKOHAMA, KOHOKU-KU |
YOKOHAMA, KANAGAWA, JAPAN 222-8552 |
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MAIER & MAIER, PLLC |
345 SOUTH PATRICK STREET |
ALEXANDRIA, VA 22314 |
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05/04/2024 08:57 PM
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