Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13993829
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Filing Dt:
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07/24/2013
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Publication #:
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Pub Dt:
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11/07/2013
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Inventors:
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Daisuke Bizen, Hiroshi Makino, Makoto Ezumi, Junichi Tanaka
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Title:
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SCANNING ELECTRON MICROSCOPE AND LENGTH MEASURING METHOD USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI SHIMBASHI 1-CHOME |
| MINATO-KU |
| TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS, LLP |
| 1300 NORTH SEVENTEENTH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209-3873 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO, JAPAN 105-6409 |
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| BAKER BOTTS L.L.P. |
| 30 ROCKEFELLER PLAZA |
| NEW YORK, NY 10112 |
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