Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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01/01/2019
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Application #:
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13541063
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Filing Dt:
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07/03/2012
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Publication #:
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Pub Dt:
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01/09/2014
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Inventors:
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Giovanni Ferrara, Cheow Guan Lim
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Title:
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INTEGRATED DEFECT DETECTION AND LOCATION SYSTEMS AND METHODS IN SEMICONDUCTOR CHIP DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| AM CAMPEON 1-12 |
| NEUBIBERG, GERMANY 85579 |
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| AMY M. SALMELA |
| 80 SOUTH 8TH STREET |
| 4800 IDS CENTER |
| MINNEAPOLIS, MN 55402 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SIEMENSSTRASSE 2 |
| VILLACH, AUSTRIA 9500 |
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| AMY M. SALMELA |
| 80 SOUTH 8TH STREET |
| 4800 IDS CENTER |
| MINNEAPOLIS, MN 55402 |
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