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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/30/2014
Application #:
13789156
Filing Dt:
03/07/2013
Publication #:
Pub Dt:
02/13/2014
Inventor:
Kei SHIMURA
Title:
Defect Inspection Apparatus And Defect Inspection Method
Assignment: 1
Reel/Frame:
030192/0658Recorded: 04/11/2013Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/08/2013
Assignee:
24-14, NISHI SHIMBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN 105-8717
Correspondent:
CROWELL & MORING LLP
P.O. BOX 14300
INTELLECTUAL PROPERTY GROUP
WASHINGTON, DC 20044-4300
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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