Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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09/01/2015
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Application #:
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13584630
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Filing Dt:
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08/13/2012
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Publication #:
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Pub Dt:
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02/13/2014
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Inventors:
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David Lamb, Kendrick Owen Daniel Franzen, David Hossack
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Title:
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SEMICONDUCTOR CIRCUIT AND METHODOLOGY FOR IN-SYSTEM SCAN TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| RORMOSEVEJ 2B ST. |
| ALLEROD, DENMARK DK-3450 |
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| KENYON & KENYON LLP |
| 1500 K STREET, NW |
| WASHINGTON, DC 20005-1257 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3RD FLOOR, PAR LA VILLE PLACE 14 |
| PAR LA VILLE ROAD |
| HAMILTON, BERMUDA |
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| KENYON & KENYON, LLP |
| ONE BROADWAY |
| NEW YORK, NY 10004 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 3RD FLOOR, PAR LA VILLE PLACE, PAR LA VILLE ROAD |
| HAMILTON, BERMUDA |
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| ANALOG DEVICES, INC. |
| ONE ANALOG WAY |
| WILMINGTON, MA 01887 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| BAY F1 RAHEEN INDUSTRIAL ESTATE |
| CO. LIMERICK |
| LIMERICK, IRELAND |
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| ANALOG DEVICES, INC. |
| ONE ANALOG WAY |
| WILMINGTON, MA 01887 |
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