Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/21/2015
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Application #:
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13975413
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Filing Dt:
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08/26/2013
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Publication #:
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Pub Dt:
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02/27/2014
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Inventors:
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Yoshihata YANASE, Hiroshi Shirai, Jun Komiyama, Hiroshi Oishi
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Title:
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METHOD OF ANALYZING NITRIDE SEMICONDUCTOR LAYER AND METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE USING THE ANALYSIS METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-3, OHSAKI 1-CHOME |
| SHINAGAWA-KU, TOKYO, JAPAN |
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| BUCHANAN INGERSOLL & ROONEY |
| P.O. BOX 1404 |
| ALEXANDRIA, VA 22313-1404 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 11-1, OSAKI 2-CHOME |
| SHINAGAWA-KU |
| TOKYO, JAPAN 141-0032 |
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| BUCHANAN, INGERSOLL & ROONEY PC |
| 1737 KING STREET, SUITE 500 |
| ALEXANDRIA, VA 22313-1404 |
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