Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13949902
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Filing Dt:
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07/24/2013
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Publication #:
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Pub Dt:
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03/06/2014
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Inventors:
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Hitoshi YAMANAKA, Kenichi GOMI
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Title:
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SEMICONDUCTOR DEVICE AND MEMORY TEST METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME |
| NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211-8588, JAPAN |
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| 2-10-23 SHIN-YOKOHAMA |
| KOHOKU-KU, YOKOHAMA-SHI |
| KANAGAWA 222-0033, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: PAUL I. KRAVETZ |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1 KAMIKODANAKA 4-CHOME, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA, JAPAN 211-8588 |
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| 2-10-23 SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
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| STAAS & HALSEY LLP |
| 1201 NEW YORK AVE. |
| SUITE 700 |
| WASHINGTON, DC 20005 |
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