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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/21/2014
Application #:
14053750
Filing Dt:
10/15/2013
Publication #:
Pub Dt:
05/08/2014
Inventors:
Kai WANG, HungLin CHEN, Yin LONG, Qiliang NI, MingShen KUO
Title:
METHOD OF DETECTING THE CIRCULAR UNIFORMITY OF THE SEMICONDUCTOR CIRCULAR CONTACT HOLES
Assignment: 1
Reel/Frame:
031404/0066Recorded: 10/15/2013Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Assignee:
NO. 568 GAO SI ROAD
ZHANGJIANG HI-TECH PARK, PUDONG
SHANGHAI, CHINA 201210
Correspondent:
RENNER OTTO BOISSELLE & SKLAR, LLP
1621 EUCLID AVENUE
NINETEENTH FLOOR
CLEVELAND, OH 44115

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