Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/31/2015
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Application #:
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13898736
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Filing Dt:
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05/21/2013
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Publication #:
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Pub Dt:
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09/18/2014
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Inventors:
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Kai Cao, Dennis G. Emge, Zhiqin Wang, Jamie M. Sullivan, Wenjian Cai, Henrik Nielsen
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Title:
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IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| KWAN & OLYNICK LLP |
| 1300 CLAY STREET, SUITE 600 |
| OAKLAND, CA 94612 |
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