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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
14302370
Filing Dt:
06/11/2014
Publication #:
Pub Dt:
10/02/2014
Inventors:
Mehran Nasser-Ghodsi, Mark Borowicz, Dave Bakker, Mehdi Vaez-Iravani, Prashant Aji et al
Title:
Methods and Systems for Measuring a Characteristic of a Substrate or Preparing a Substrate for Analysis
Assignment: 1
Reel/Frame:
033082/0362Recorded: 06/11/2014Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/21/2005
Exec Dt:
03/21/2005
Exec Dt:
03/21/2005
Exec Dt:
03/17/2005
Exec Dt:
03/17/2005
Exec Dt:
03/16/2005
Exec Dt:
03/21/2005
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
ENTROPY MATTERS LLC
P.O. BOX 2250
NEW YORK, NY 10021

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