Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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14287460
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Filing Dt:
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05/27/2014
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Publication #:
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Pub Dt:
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12/04/2014
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Inventors:
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Tetsuya Sada, Jun Nishiyama, Yu Konta, Kiyomi Oshima, Hiromi Saito, Shuichi Takei
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Title:
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DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1 AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 107-6325, JAPAN |
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| 4-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU |
| TOKYO, JAPAN |
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| ABELMAN FRAYNE & SCHWAB/TEL |
| 666 THIRD AVENUE |
| 10TH FLOOR |
| NEW YORK, NY 10017-5621 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1 AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 107-6325, JAPAN |
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| ABELMAN, FRAYNE & SCHWAB/LEE |
| 666 THIRD AVENUE |
| 10TH FLOOR |
| NEW YORK, NY 10017-5621 |
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