Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/11/2017
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Application #:
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14371317
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Filing Dt:
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07/09/2014
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Publication #:
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Pub Dt:
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01/01/2015
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Inventors:
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Yasuo Sato, Seiji Kajihara
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Title:
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TEST PATTERN GENERATION DEVICE, FAULT DETECTION SYSTEM, TEST PATTERN GENERATION METHOD, PROGRAM AND RECORDING MEDIUM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SENSUI-CHO, TOBATA-KU, KITAKYUSHU-SHI |
| FUKUOKA, JAPAN 804-8550 |
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| RANKIN, HILL & CLARK LLP |
| 23755 LORAIN ROAD, SUITE 200 |
| NORTH OLMSTED, OH 44070-2224 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1-8, HON-CHO, KAWAGUCHI-SHI |
| SAITAMA, JAPAN 332-0012 |
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| RANKIN, HILL & CLARK LLP |
| 23755 LORAIN ROAD, SUITE 200 |
| NORTH OLMSTED, OH 44070 |
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