Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/04/2017
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Application #:
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14498905
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Filing Dt:
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09/26/2014
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Publication #:
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Pub Dt:
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01/15/2015
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Inventors:
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David Keith, Aaron Durbin, Morgan Johnson
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Title:
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WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7685 SW CIRRUS DRIVE |
| TIGARD, OREGON 97008 |
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| PERKINS COIE LLP |
| P. O. BOX 1247 |
| SEATTLE, WA 98111-1247 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 46575 FREMONT BLVD |
| FREMONT, CALIFORNIA 94538 |
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| PERKINS COIE LLP |
| P. O. BOX 1247 |
| SEATTLE, WA 98111-1247 |
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