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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
14331168
Filing Dt:
07/14/2014
Publication #:
Pub Dt:
02/12/2015
Inventors:
Ji Hoon KIM, Sung Yeol Park
Title:
THICKNESS MEASUREMENT DEVICE AND METHOD FOR MEASURING THICKNESS
Assignment: 1
Reel/Frame:
033322/0054Recorded: 07/16/2014Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/25/2014
Exec Dt:
06/25/2014
Assignee:
MAEYOUNG-RO 150 (MAETAN-DONG), YOUNGTONG-GU, SUWON-SI
GYEONGGI-DO, KOREA, REPUBLIC OF 443-743
Correspondent:
LADAS & PARRY LLP
5670 WILSHIRE BLVD
SUITE 2100
LOS ANGELES, CA 90036-5679

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