Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/08/2018
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Application #:
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14533974
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Filing Dt:
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11/05/2014
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Publication #:
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Pub Dt:
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03/05/2015
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Inventors:
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Masahiro Hatakeyama, Yoshihiko Naito, Norio Kimura, Takeshi Murakami, Kenji Terao et al
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Title:
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SPECIMEN OBSERVATION METHOD AND DEVICE USING SECONDARY EMISSION ELECTRON AND MIRROR ELECTRON DETECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 11-1, HANEDA ASAHI-CHO, OHTA-KU |
| TOKYO, JAPAN 144-8510 |
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| RYAN B. CHIRNOMAS |
| WESTERMAN HATTORI DANIELS & ADRIAN LLP |
| 1250 CONNECTICUT AVENUE NW, STE. 700 |
| WASHINGTON, DC 20036 |
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