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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/14/2015
Application #:
14154432
Filing Dt:
01/14/2014
Publication #:
Pub Dt:
04/09/2015
Inventors:
Chen-Fu Chien, Kuo-Hao Chang, Ying-Jen Chen
Title:
Method of Defect Image Classification through Integrating Image Analysis and Data Mining
Assignment: 1
Reel/Frame:
032018/0688Recorded: 01/14/2014Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Exec Dt:
10/14/2013
Assignee:
NO.101, SEC. 2, GUANGFU RD.
EAST DIST.
HSINCHU CITY, TAIWAN 300
Correspondent:
JACKSON INTELLECTUAL PROPERTY GROUP PLLC
106 STARVALE LANE
SHIPMAN, VA 22971

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