Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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09/12/2017
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Application #:
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14442081
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Filing Dt:
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05/11/2015
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Publication #:
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Pub Dt:
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10/22/2015
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Inventors:
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Oleg Kononchuk, Didier Dutartre
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Title:
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METHOD FOR MEASURING THICKNESS VARIATIONS IN A LAYER OF A MULTILAYER SEMICONDUCTOR STRUCTURE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| CHEMIN DES FRANQUES |
| PARC TECHNOLOGIQUE DES FONTAINES |
| BERNIN, FRANCE 38190 |
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| TRASKBRITT, P.C. |
| P.O. BOX 2550 |
| SALT LAKE CITY, UT 84110 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 850, RUE JEAN MONNET |
| CROLLES, FRANCE F-38920 |
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| TRASKBRITT, P.C. |
| P.O. BOX 2550 |
| SALT LAKE CITY, UT 84110 |
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Assignment:
3
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LICENSE (SEE DOCUMENT FOR DETAILS).
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| MANFRED-VON-ARDENNE-RING 4 |
| DRESDEN, GERMANY 01099 |
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| COLSON LAW GROUP |
| 5555 MAIN STREET |
| BUFFALO, NY 14221 |
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