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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/02/2017
Application #:
14688739
Filing Dt:
04/16/2015
Publication #:
Pub Dt:
12/24/2015
Inventors:
Timothy Goodwin, Lena Nicolaides, Mohan Mahadevan, Paul Horn, Shifang Li
Title:
Automated Inline Inspection of Wafer Edge Strain Profiles Using Rapid Photoreflectance Spectroscopy
Assignment: 1
Reel/Frame:
039437/0680Recorded: 08/15/2016Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/17/2015
Exec Dt:
08/12/2016
Exec Dt:
04/16/2015
Exec Dt:
08/11/2016
Exec Dt:
08/11/2016
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299

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