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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/08/2019
Application #:
14881847
Filing Dt:
10/13/2015
Publication #:
Pub Dt:
04/14/2016
Inventors:
Jian Ding, Priya Mukundhan, James Kane, Steven Peterson, Fei Shen
Title:
CALIBRATION OF SEMICONDUCTOR METROLOGY SYSTEMS
Assignment: 1
Reel/Frame:
041556/0834Recorded: 03/13/2017Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/22/2016
Exec Dt:
02/19/2016
Exec Dt:
02/22/2016
Exec Dt:
02/19/2016
Exec Dt:
02/19/2016
Assignee:
16 JONSPIN ROAD
WILLINGTON, MASSACHUSETTS 01887
Correspondent:
MERCHANT & GOULD P.C.
P.O. BOX 2903
MINNEAPOLIS, MN 55402-0903
Assignment: 2
Reel/Frame:
053084/0545Recorded: 06/30/2020Pages: 81
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/12/2020
Assignee:
16 JONSPIN ROAD
WILMINGTON, MASSACHUSETTS 01887
Correspondent:
NESREEN GHEITA
184 SHEPHERDS BUSH ROAD
LONDON, W6 7NL UNITED KINGDOM

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