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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
9508611
Issue Dt:
11/29/2016
Application #:
14911651
Filing Dt:
02/11/2016
Publication #:
20160190020
Pub Dt:
06/30/2016
Inventors:
Natsuki TSUNO, Renichi YAMADA, Toshiyuki OHNO, Yuki MORI, Yoshinobu KIMURA, Hiroya OHTA et al
Title:
SEMICONDUCTOR INSPECTION METHOD, SEMICONDUCTOR INSPECTION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR ELEMENT
Assignment: 1
Reel/Frame:
040182/0955Recorded: 09/29/2016Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
KIMURA, YOSHINOBU
Exec Dt:
08/03/2016
TSUNO, NATSUKI
Exec Dt:
08/05/2016
OHTA, HIROYA
Exec Dt:
08/19/2016
YAMADA, RENICHI
Exec Dt:
08/25/2016
HAMAMURA, HIROTAKA
Exec Dt:
08/30/2016
OHNO, TOSHIYUKU
Exec Dt:
08/31/2016
OKINO, HIROYUKI
Exec Dt:
08/25/2016
MORI, YUKI
Exec Dt:
09/01/2016
Assignee:
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME
CHIYODA-KU
TOKYO, JAPAN 100-8280
Correspondent:
MILES & STOCKBRIDGE P.C.
1751 PINNACLE DRIVE
SUITE 1500
TYSONS CORNER, VA 22102

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