Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/28/2017
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Application #:
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15001373
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Filing Dt:
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01/20/2016
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Publication #:
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Pub Dt:
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07/21/2016
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Inventors:
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Karthik Balakrishnan, Bruce M. Fleischer, Keith A. Jenkins, Christos Vezyrtzis
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Title:
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TEST STRUCTURE TO MEASURE DELAY VARIABILITY MISMATCH OF DIGITAL LOGIC PATHS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NEW ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
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OTTERSTEDT, ELLENBOGEN & KAMMER, LLP |
P.O. BOX 381 |
COS COB, CT 06807-0381 |
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