skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Total Assignments: 1
Patent #:
9530199
Issue Dt:
12/27/2016
Application #:
14798283
Filing Dt:
07/13/2015
Publication #:
20170018066
Pub Dt:
01/19/2017
Inventors:
Yakov WEINBERG, Ishai SCHWARZBAND, Roman KRIS, Itay ZAUER, Ran GOLDMAN, Olga NOVAK et al
Title:
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRUCTURE
Assignment: 1
Reel/Frame:
037064/0531Recorded: 11/17/2015Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
WEINBERG, YAKOV
Exec Dt:
11/02/2015
SCHWARZBAND, ISHAI
Exec Dt:
11/03/2015
KRIS, ROMAN
Exec Dt:
11/02/2015
ZAUER, ITAY
Exec Dt:
11/17/2015
GOLDMAN, RAN
Exec Dt:
11/04/2015
NOVAK, OLGA
Exec Dt:
11/17/2015
RATHORE, DHANANJAY SINGH
Exec Dt:
11/04/2015
ADAN, OFER
Exec Dt:
11/04/2015
LEVI, SHIMON
Exec Dt:
11/04/2015
Assignee:
APPLIED MATERIALS ISRAEL LTD.
9 OPPENHEIMER STREET
PARK RABIN, REHOVOT, ISRAEL 76705
Correspondent:
LOWENSTEIN SANDLER LLP
65 LIVINGSTON AVENUE
ROSELAND, NJ 07068

Search Results as of: 06/03/2024 06:07 PM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT