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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/07/2018
Application #:
15582331
Filing Dt:
04/28/2017
Publication #:
Pub Dt:
11/02/2017
Inventor:
Shankar Krishnan
Title:
Porosity Measurement Of Semiconductor Structures
Assignment: 1
Reel/Frame:
042328/0544Recorded: 05/10/2017Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/10/2017
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSEPH S SPANO
851 BURLWAY ROAD, SUITE 407
BURLINGAME, CA 94010

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