Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
08/21/2018
|
Application #:
|
15550014
|
Filing Dt:
|
08/09/2017
|
|
Publication #:
|
|
Pub Dt:
|
01/25/2018
| | | | |
|
Inventors:
|
David A. REED, Bruno W SCHUELER, Bruce H NEWCOME, Rodney SMEDT, Chris BEVIS
|
|
Title:
|
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 3090 OAKMEAD VILLAGE DRIVE |
| SANTA CLARA, CALIFORNIA 95051 |
|
|
|
|
| WOMBLE BOND DICKINSON (US) LLP |
| 1841 PAGE MILL ROAD, SUITE 200 |
| PALO ALTO, CA 94304 |
|
|
Search Results as of:
05/29/2024 12:32 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
