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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/20/2020
Application #:
15792061
Filing Dt:
10/24/2017
Publication #:
Pub Dt:
02/15/2018
Inventors:
Hirotomo YASHIMA, Naoshi SAKAGUCHI, Takahiro MICHIMOTO
Title:
X-RAY INSPECTION DEVICE, X-RAY INSPECTION METHOD, AND METHOD OF MANUFACTURING STRUCTURE
Assignment: 1
Reel/Frame:
044536/0669Recorded: 01/04/2018Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/28/2017
Exec Dt:
11/29/2017
Exec Dt:
11/29/2017
Assignee:
15-3, KONAN 2-CHOME, MINATO-KU
TOKYO, JAPAN 108-6290
Correspondent:
FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP
901 NEW YORK AVENUE
WASHINGTON, DC 20001

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