Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
02/26/2019
|
Application #:
|
15782692
|
Filing Dt:
|
10/12/2017
|
|
Publication #:
|
|
Pub Dt:
|
02/22/2018
| | | | |
|
Inventors:
|
Mei Sun, Earl Jensen, Kevin O'Brien
|
|
Title:
|
Method and System for Measuring Radiation and Temperature Exposure of Wafers Along a Fabrication Process Line
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
|
|
|
|
| SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER |
| 14301 FNB PARKWAY |
| SUITE 220 |
| OMAHA, NE 68154-5299 |
|
|
Search Results as of:
05/21/2024 06:36 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
