Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/17/2019
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Application #:
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15706409
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Filing Dt:
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09/15/2017
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Publication #:
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Pub Dt:
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03/22/2018
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Inventors:
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Qiang Wu, Wei Xiong, Xuan Li
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Title:
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DEFECT INSPECTION METHOD AND APPARATUS USING MICRO LENS MATRIX
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 18 ZHANG JIANG ROAD, PUDONG NEW AREA |
| SHANGHAI, CHINA 201203 |
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| 18 WEN CHANG ROAD, ECONOMICAL-TECHNOLOGICAL DEVELOPMENT AREA, DAXING DISTRICT |
| BEIJING, CHINA 100176 |
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| KILPATRICK TOWNSEND & STOCKTON LLP |
| TWO EMBARCARDERO CENTER |
| EIGHT FLOOR |
| SAN FRANCISCO, CA 94111 |
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