Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/03/2020
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Application #:
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15691178
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Filing Dt:
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08/30/2017
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Publication #:
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Pub Dt:
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08/02/2018
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Inventors:
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Keiichiro SOMEDA, Kazuo WATABE, Michihiko INUKAI, Osamu NISHIMURA
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Title:
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DETERIORATION DIAGNOSIS METHOD, A DETERIORATION DIAGNOSIS SYSTEM, AND A SENSOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| FINNEGAN HENDERSON |
| 901 NEW YORK AVE |
| WASHINGTON, DC 20001 |
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