Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/21/2020
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Application #:
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15419657
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Filing Dt:
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01/30/2017
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Publication #:
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Pub Dt:
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08/02/2018
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Inventors:
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Jie Lin, Zhaoli Zhang, Zongchang Yu
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Title:
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Method And System For Identifying Defects Of Integrated Circuits
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 156 4TH JINGHAI ROAD, BUILDING 12 |
| BEIJING ECONOMIC DEVELOPMENT DISTRICT |
| BEIJING, CHINA 100176 |
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| YOUNG BASILE HANLON & MACFARLANE P.C. |
| 3001 WEST BIG BEAVER ROAD |
| SUITE 624 |
| TROY, MI 48084 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE THIRD INVENTOR'S DATA PREVIOUSLY RECORDED ON REEL 041157 FRAME 0550. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| 156 4TH JINGHAI ROAD, BUILDING 12 |
| BEIJING ECONOMIC DEVELOPMENT DISTRICT |
| BEIJING, CHINA 100176 |
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| YOUNG BASILE |
| 3001 W. BIG BEAVER ROAD |
| SUITE 624 |
| TROY, MI 48084 |
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