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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/23/2020
Application #:
15896978
Filing Dt:
02/14/2018
Publication #:
Pub Dt:
08/23/2018
Inventors:
Shankar Krishnan, Alexander Buettner, Noam Sapiens, Kevin A. Peterlinz et al
Title:
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures
Assignment: 1
Reel/Frame:
045402/0696Recorded: 03/30/2018Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/15/2018
Exec Dt:
02/14/2018
Exec Dt:
02/15/2018
Exec Dt:
02/15/2018
Exec Dt:
02/15/2018
Exec Dt:
03/30/2018
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSEPH S SPANO
851 BURLWAY ROAD, SUITE 407
BURLINGAME, CA 94010

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