Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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05/21/2019
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Application #:
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15756160
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Filing Dt:
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02/28/2018
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Publication #:
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Pub Dt:
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08/30/2018
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Inventors:
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Wataru Kada, Kenta Miura, Osamu Hanaizumi, Tomihiro Kamiya, Takahiro Satoh et al
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Title:
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Charged Particle Radiation Measuring Method And Charged Particle Radiation Measuring Device
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, NIHONBASHI-MUROMACHI |
| 2-CHOME |
| CHUO-KU, TOKYO, JAPAN 1038338 |
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| SERVILLA WHITNEY LLC |
| 33 WOOD AVENUE SOUTH |
| SUITE 830 |
| ISELIN, NJ 08830 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2, ARAMAKI-MACHI 4-CHOME |
| MAEBASHI-SHI, GUNMA, JAPAN 3718510 |
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| SERVILLA WHITNEY LLC |
| 33 WOOD AVENUE SOUTH |
| SUITE 830 |
| ISELIN, NJ 08830 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-9-1, ANAGAWA, INAGE-KU |
| CHIBA-SHI |
| CHIBA, JAPAN 2638555 |
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| SERVILLA WHITNEY LLC |
| 33 WOOD AVENUE SOUTH |
| SUITE 830 |
| ISELIN, NJ 08830 |
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