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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
15912365
Filing Dt:
03/05/2018
Publication #:
Pub Dt:
10/04/2018
Inventors:
Matthew Scott ROGERS, Stephen MOFFATT, Heng PAN, Aaron Muir HUNTER
Title:
APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION
Assignment: 1
Reel/Frame:
045119/0554Recorded: 03/06/2018Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/03/2012
Exec Dt:
12/07/2012
Exec Dt:
12/04/2012
Exec Dt:
12/09/2012
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
PATTERSON + SHERIDAN, LLP
24 GREENWAY PLAZA, SUITE 1600
HOUSTON, TX 77046

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