Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/28/2019
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Application #:
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15604671
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Filing Dt:
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05/25/2017
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Publication #:
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Pub Dt:
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10/04/2018
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Inventors:
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Chung-Long Pan, Mei-Hui Guo, Yu-Jung Huang, Shih-Chun Lin
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Title:
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DEFECT DETECTION METHOD FOR 3D CHIP AND SYSTEM USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.1, SEC. 1, SYUECHENG RD., DASHU DISTRICT, |
| KAOHSIUNG CITY, TAIWAN 84001 |
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| JIANQ CHYUN INTELLECTUAL PROPERTY OFFICE |
| 7F.-1, NO. 100, ROOSEVELT RD., SEC. 2, |
| TAIPEI, 100 TAIWAN |
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