Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/18/2020
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Application #:
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15982918
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Filing Dt:
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05/17/2018
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Publication #:
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Pub Dt:
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11/22/2018
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Inventors:
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Ishai SCHWARZBAND, Yan AVNIEL, Sergey KHRISTO, Mor BARAM, Shimon LEVI, Doron GIRMONSKY et al
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Title:
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MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 9 OPPENHEIMER STREET |
| PARK RABIN |
| REHOVOT, ISRAEL 76705 |
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| LOWENSTEIN SANDLER LLP |
| ONE LOWENSTEIN DRIVE |
| ROSELAND, NJ 07068 |
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