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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/21/2020
Application #:
15989459
Filing Dt:
05/25/2018
Publication #:
Pub Dt:
11/29/2018
Inventors:
Yuji Konyuba, Kazuya Omoto, Hidetaka Sawada
Title:
Distortion Measurement Method for Electron Microscope Image, Electron Microscope, Distortion Measurement Specimen, and Method of Manufacturing Distortion Measurement Specimen
Assignment: 1
Reel/Frame:
045902/0414Recorded: 05/25/2018Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/17/2018
Exec Dt:
05/18/2018
Exec Dt:
05/17/2018
Assignee:
3-1-2 MUSASHINO, AKISHIMA
TOKYO, JAPAN 196-8558
Correspondent:
THE WEBB LAW FIRM
ONE GATEWAY CENTER
420 FT. DUQUESNE BLVD., SUITE 1200
PITTSBURGH, PA 15222

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