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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
07/05/2022
Application #:
15672120
Filing Dt:
08/08/2017
Publication #:
Pub Dt:
02/07/2019
Inventors:
Tianhan Wang, Aaron Rosenberg, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen et al
Title:
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
Assignment: 1
Reel/Frame:
044076/0568Recorded: 11/08/2017Pages: 18
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/15/2017
Exec Dt:
08/16/2017
Exec Dt:
08/16/2017
Exec Dt:
08/16/2017
Exec Dt:
08/15/2017
Exec Dt:
08/21/2017
Exec Dt:
08/18/2017
Exec Dt:
08/21/2017
Exec Dt:
08/18/2017
Exec Dt:
08/18/2017
Exec Dt:
08/16/2017
Exec Dt:
08/18/2017
Exec Dt:
08/18/2017
Exec Dt:
08/18/2017
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
060256/0184Recorded: 06/02/2022Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/19/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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