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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/27/2023
Application #:
15960701
Filing Dt:
04/24/2018
Publication #:
Pub Dt:
02/14/2019
Inventors:
MIN CHUL PARK, JEONG HOON KO, JI YONG PARK, JE HYUN LEE, DAE SIN KIM
Title:
WAFER MAP ANALYZER, METHOD FOR ANALYZING WAFER MAP USING THE SAME AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
045620/0201Recorded: 04/24/2018Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/02/2018
Exec Dt:
02/05/2018
Exec Dt:
04/20/2018
Exec Dt:
02/05/2018
Exec Dt:
04/20/2018
Assignee:
129, SAMSUNG-RO, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16677
Correspondent:
VOLENTIE, WHITT & FRANCOS, PLLC
11951 FREEDOM DRIVE, SUITE 1300
RESTON, VA 20190

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