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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/06/2020
Application #:
15833640
Filing Dt:
12/06/2017
Publication #:
Pub Dt:
02/28/2019
Inventors:
Ta-Ching YU, Shih-Che WANG, Shu-Hao CHANG, Yi-Hao CHEN, Chen-Yen KAO, Te-Chih HUANG et al
Title:
METHODS OF DEFECT INSPECTION
Assignment: 1
Reel/Frame:
053663/0060Recorded: 09/01/2020Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/06/2018
Exec Dt:
03/06/2018
Exec Dt:
07/14/2020
Exec Dt:
03/01/2018
Exec Dt:
03/06/2018
Exec Dt:
03/01/2018
Assignee:
NO.8, LI-HSIN RD. 6, SCIENCE BASED INDUSTRIAL PARK
HSINCHU, TAIWAN 300
Correspondent:
MCDERMOTT WILL & EMERY LLP
THE MCDERMOTT BUILDING
500 NORTH CAPITOL STREET, NW
WASHINGTON, DC 20001

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