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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
10481112
Issue Dt:
11/19/2019
Application #:
16181287
Filing Dt:
11/05/2018
Publication #:
20190086342
Pub Dt:
03/21/2019
Inventors:
David A. Reed, Rodney Smedt, Heath A. Pois, Bruno W. Schueler, Jeffrey T. Fanton
Title:
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-ANGLE X-RAY REFLECTANCE SCATTEROMETRY (XRS)
Assignment: 1
Reel/Frame:
050691/0773Recorded: 10/11/2019Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
POIS, HEATH A.
Exec Dt:
10/17/2014
REED, DAVID A.
Exec Dt:
10/17/2014
SCHUELER, BRUNO W.
Exec Dt:
10/17/2014
SMEDT, RODNEY
Exec Dt:
10/17/2014
FANTON, JEFFREY T.
Exec Dt:
10/17/2014
Assignee:
REVERA, INCORPORATED
3090 OAKMEAD VILLAGE DRIVE
SANTA CLARA, CALIFORNIA 95051
Correspondent:
WOMBLE BOND DICKINSON (US) LLP
P.O. BOX 7037
ATLANTA, GA 30357-0037
Assignment: 2
Reel/Frame:
050708/0825Recorded: 10/14/2019Pages: 4
Conveyance:
MERGER (SEE DOCUMENT FOR DETAILS).
Assignor:
REVERA, INCORPORATED
Exec Dt:
11/08/2017
Assignee:
NOVA MEASURING INSTRUMENTS, INC.
3090 OAKMEAD VILLAGE DRIVE
SANTA CLARA, CALIFORNIA 95051
Correspondent:
WOMBLE BOND DICKINSON (US) LLP
P.O. BOX 7037
ATLANTA, GA 30357-0037

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