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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
11/05/2019
Application #:
16085890
Filing Dt:
09/17/2018
Publication #:
Pub Dt:
03/28/2019
Inventors:
Takahiro URANO, Hisashi HATANO, Toshifumi HONDA, Mamoru KOBAYASHI, Hironori SAKURAI
Title:
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
Assignment: 1
Reel/Frame:
046983/0864Recorded: 09/26/2018Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/18/2018
Exec Dt:
06/21/2018
Exec Dt:
06/21/2018
Exec Dt:
06/21/2018
Exec Dt:
06/21/2018
Assignee:
24-14, NISHI SHIMBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN 105-8717
Correspondent:
ERIC G. KING
MILES & STOCKBRIDGE PC
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102-3833
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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