Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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15856148
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Filing Dt:
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12/28/2017
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Publication #:
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Pub Dt:
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07/04/2019
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Inventors:
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Hiroshi SHIKAUCHI, Tomonori HOTATE, Yuki TANAKA, Shinji KUDOH
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Title:
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Semiconductor Device and Method for Detecting a Crack of the Semiconductor Device
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-6-3 KITANO |
| NIIZA-SHI |
| SAITAMA, JAPAN 352-8666 |
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| HARNESS, DICKEY & PIERCE, P.L.C. |
| P.O. BOX 828 |
| BLOOMFIELD HILLS, MI 48303 |
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