Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/08/2022
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Application #:
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16267573
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Filing Dt:
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02/05/2019
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Publication #:
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Pub Dt:
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08/08/2019
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Inventors:
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Alexandre SARAFIANOS, Bruno NICOLAS, Daniele FRONTE
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Title:
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METHOD FOR DETECTING A BREACH OF THE INTEGRITY OF A SEMICONDUCTOR SUBSTRATE OF AN INTEGRATED CIRCUIT FROM ITS REAR FACE, AND CORRESPONDING DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ZI DE PEYNIER-ROUSSET, AVENUE COQ |
| ROUSSET, FRANCE 13790 |
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| CROWE & DUNLEVY - ST-EP INTELLECTUAL PRO |
| 1919 MCKINNEY AVENUE |
| SUITE 100 |
| DALLAS, TX 75201 |
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