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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/27/2022
Application #:
16254951
Filing Dt:
01/23/2019
Publication #:
Pub Dt:
10/03/2019
Inventors:
Shivam Agarwal, Hariharasudhan Koteeswaran, Priyank Jain, Suvi Murugan, Yuan Zhong
Title:
Auto-Correlation of Wafer Characterization Data and Generation of Composite Wafer Metrics During Semiconductor Device Fabrication
Assignment: 1
Reel/Frame:
048479/0516Recorded: 03/01/2019Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/23/2019
Exec Dt:
01/23/2019
Exec Dt:
02/27/2019
Exec Dt:
02/28/2019
Exec Dt:
02/05/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
061043/0802Recorded: 08/02/2022Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/19/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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