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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	10734190	Issue Dt:	08/04/2020	Application #:	16415581	Filing Dt:	05/17/2019
Publication #:	20190355547	Pub Dt:	11/21/2019
Inventors:	Atsushi Ando, Munehiro Ogasawara, Riki Ogawa, John Hartley
Title:	MULTIPLE ELECTRON BEAM IRRADIATION APPARATUS, MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON BEAM IRRADIATION METHOD

Assignment: 1

Reel/Frame:

049213/0621

Recorded: 05/17/2019

Pages: 6

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

ANDO, ATSUSHI

Exec Dt:

12/20/2018

OGASAWARA, MUNEHIRO

Exec Dt:

12/19/2018

OGAWA, RIKI

Exec Dt:

01/16/2019

HARTLEY, JOHN

Exec Dt:

05/15/2019

Assignees:

NUFLARE TECHNOLOGY, INC.

8-1, SHINSUGITA-CHO

ISOGO-KU

YOKOHAMA-SHI, JAPAN 235-8522

NUFLARE TECHNOLOGY AMERICA, INC.

1294 HAMMERWOOD AVENUE

SUNNYVALE, CALIFORNIA 94089

Correspondent:

OBLON LLP

1940 DUKE STREET

ALEXANDRIA, VA 22314

Assignment: 2

Reel/Frame:

049914/0864

Recorded: 07/31/2019

Pages: 8

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECT FIRST ASSIGNEE' ADDRESS PREVIOUSLY RECORDED AT REEL: 049213 FRAME: 0621. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.

Assignors:

ANDO, ATSUSHI

Exec Dt:

12/20/2018