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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
09/14/2021
Application #:
16515725
Filing Dt:
07/18/2019
Publication #:
Pub Dt:
01/23/2020
Inventors:
Christopher J. Sutcliffe, Eric Jones, Hay Wong
Title:
System And Process For In-process Electron Beam Profile and Location Analyses
Assignment: 1
Reel/Frame:
053951/0805Recorded: 10/01/2020Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/05/2019
Assignee:
325 CORPORATE DRIVE
MAHWAH, NEW JERSEY 07430
Correspondent:
LERNER DAVID IP LAW
20 COMMERCE DRIVE
CRANFORD, NJ 07016
Assignment: 2
Reel/Frame:
053951/0266Recorded: 10/01/2020Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/18/2020
Exec Dt:
09/03/2019
Assignee:
FOUNDATION BUILDING, 765 BROWNLOW HILL
LIVERPOOL, UNITED KINGDOM L69 7ZX
Correspondent:
LERNER DAVID IP LAW
20 COMMERCE DRIVE
CRANFORD, NJ 07016
Assignment: 3
Reel/Frame:
062180/0395Recorded: 12/22/2022Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/28/2022
Assignee:
325 CORPORATE DRIVE
MAHWAH, NEW JERSEY 07430
Correspondent:
LERNER, DAVID, LITTENBERG, KRUMHOLZ & MENTLIK, LLP
20 COMMERCE DR.
CRANFORD, NJ 07016

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