Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/26/2021
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Application #:
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16592661
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Filing Dt:
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10/03/2019
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Publication #:
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Pub Dt:
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01/30/2020
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Inventors:
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Pieter KRUIT, Aernout ZONNEVYLLE, Yan REN
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Title:
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APPARATUS AND METHOD FOR INSPECTING A SAMPLE USING A PLURALITY OF CHARGED PARTICLE BEAMS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| STEVINWEG 1 |
| DELFT, NETHERLANDS 2628 CN |
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| NORMAN P. SOLOWAY |
| 4640 E. SKYLINE DRIVE |
| TUCSON, AZ 85718 |
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