Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16671410
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Filing Dt:
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11/01/2019
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Publication #:
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Pub Dt:
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02/27/2020
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Inventors:
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Junichi Hagihara, Kunihiro Furuya, Naoki Muramatsu, Shigekazu Komatsu, Tadayoshi Hosaka
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Title:
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WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1 AKASAKA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN 107-6325 |
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| PEARNE & GORDON LLP |
| 1801 EAST 9TH STREET |
| SUITE 1200 |
| CLEVELAND, OH 44114-3108 |
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