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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
08/17/2021
Application #:
16420408
Filing Dt:
05/23/2019
Publication #:
Pub Dt:
04/09/2020
Inventor:
Arpit Yati
Title:
Deep Learning Based Adaptive Regions of Interest for Critical Dimension Measurements of Semiconductor Substrates
Assignment: 1
Reel/Frame:
050026/0263Recorded: 08/12/2019Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/30/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
056762/0395Recorded: 06/29/2021Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/19/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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